Nikon Metrology Inc.
Andrew Ramsey studied physical sciences at the University of Cambridge, UK, from 1983 to 1986, and graduated in 1986. He then joined the United Kingdom Atomic Energy Authority (UKAEA), where he worked for 13 years in their Harwell and Culham Laboratories near Oxford, UK, to develop software for non-destructive testing (NDT) image analysis. He has been involved in X-ray computed tomography (CT) since 1992 and helped develop one of the world’s first PC-based X-ray CT systems.
While at UKAEA he worked closely with high-resolution industrial X-ray machine manufacturer X-Tek Systems Ltd. in Tring, UK, and finally joined them in 1999 as a software engineer. There he developed X-Tek’s first CT reconstruction software and became the software department manager, as well as helping the sales department with technical inquiries. Andrew moved into the Sales Department in 2006, giving technical support to sales staff and agents worldwide as well as promoting CT technology. Following the acquisition of X-Tek by Metris in 2007, and subsequently by Nikon in 2009, Andrew joined the X-ray Centre of Excellence supporting CT systems, agents, sales staff and customers worldwide.
He has presented at several international conferences and written many papers on CT, including being a co-author of one in “Nature” and another in “The Lancet”. Since early 2018, Andrew has supported X-ray CT customers and sales personnel in the Americas out of Nikon Metrology’s office in Brighton, Michigan.