It is so exciting that now more than ever we have more options for metrology scanning! As company demands are growing to use 3D scanning it is important to keep up on the latest hardware and data options to optimize efficiency within the industry. As demands grow with the ever-changing landscapes within the industry, design engineers, process engineers, quality engineers and plant managers need to know the solutions that are available for today’s complex problems. During this presentation, we will provide a brief description of 3D inspection hardware technologies including structured light, portable CMM laser scanning, terrestrial lidar scanning, 3D X-ray CT scanning and laser tracker. We will then explore what types of outputs we can create and how to apply them for best efficiency. The outputs for reverse engineering will include raw point cloud, representative non-watertight mesh, watertight mesh, NURBS, as-is clean CAD, design intent clean CAD, hybrid and native CAD. Inspection outputs will include color map or deviation plots, spreadsheet, and dimensional analysis.
- Build a foundation needed to be successful when using advanced metrology solutions
- Understand the differences in technologies: structured light, portable CMM laser scanning, terrestrial lidar scanning, 3D X-ray CT scanning and laser tracker
- Explore different outputs such as NURBS, mesh, clean CAD, parametric models, color maps, FAIR inspections and more