X-ray CT Metrology Specialist
Nikon Metrology Inc
Herminso Villarraga-Gómez is a Physicist and Optical Engineer who specializes in methodologies for industrial applications of X-ray computed tomography (CT) in the areas of dimensional metrology, 3D imaging, and nondestructive testing (NDT). He holds a bachelor’s degree in Physics from the Universidad Nacional de Colombia (National University of Colombia) and a master’s degree in Physics from the University of Puerto Rico. Given his particular interests in applied physics, Herminso additionally earned a second master’s degree in Optics from the University of Central Florida. In 2012, he began his doctoral studies with a scholarship from the Center for Precision and Metrology (CPM) at the University of North Carolina, Charlotte. He has been involved in establishing the accuracy and precision of X-ray CT metrology technologies and also in comparing its performance with other existing measuring techniques, in particular coordinate measurement machines (CMMs). He has worked in collaboration with the University of North Carolina at Charlotte, the National Institute of Standards and Technology (NIST), the National Metrology Institute of Germany (PTB), and Carl Zeiss Industrial Metrology. Since 2015, Herminso has been working with Nikon Metrology, Inc. (USA) where he is employed full-time as an X-ray/CT Metrology Specialist.