X-ray CT Metrology Specialist
Nikon Metrology Inc
Herminso is a Physicist and Optical Engineer who specializes in X-ray computed tomography (CT) for dimensional metrology, 3D imaging, and nondestructive testing (NDT). Herminso studied Physics at the Universidad Nacional de Colombia (National University of Colombia) and then completed a master’s degree (also in Physics) at the University of Puerto Rico. Subsequently he earned a second master’s degree in Optics from the University of Central Florida. In 2012, he began his doctoral studies with a scholarship from the Center for Precision and Metrology (CPM) at the University of North Carolina, Charlotte. At CPM, Herminso worked on methodologies for industrial applications of dimensional X-ray CT metrology in collaboration with the National Institute of Standards and Technology (NIST), the National Metrology Institute of Germany (PTB), and Carl Zeiss Industrial Metrology, LLC. Since 2015, he has worked at Nikon Metrology, Inc. (USA) as an X-ray/CT Metrology Specialist. He is a current member of the American Society for Precision Engineering (ASPE), the International Society for Optics and Photonics (SPIE), the American Society of Nondestructive Testing (ASNT), the Society of Manufacturing Engineers (SME), the IEEE Instrumentation and Measurement Society, and other professional associations for engineering and applied physics. In his spare time, Herminso enjoys farming, particularly cultivating coffee on his parents’ land in the verdant mountains of Colombia.