Nathan B. Crane PhD, Associate Professor, University of South Florida
The geometric freedom of Additive Manufacturing (AM) has opened many opportunities and new business areas. However, the possibilities increase exponentially as additional functionality such as electronics are integrated into the printed structures. However, as AM expands from printing single materials to integrated systems, new challenges to process characterization and product qualification arise that limit their use in demanding applications. In order to more quickly move from concept to production, methods are required for adapting existing testing standards to printed electronics systems. While many tests are readily adapted, there are also cases in which the existing standards are inadequate. This presentation will show how MIL-STD-883 tests for criteria such as hermeticity, delamination, shock, and temperature have been applied to printed electronic systems, highlighting both the success and limitations of applying these standard MIL-STD tests to the printed systems.